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Creators/Authors contains: "Hu, Genzhi"

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  1. ; ; ; ; ; ; ; ; ; ; et al (, Communications Earth & Environment)
    Abstract Quantifying how grain size and/or deviatoric stress impact (Mg,Fe)2SiO4phase stability is critical for advancing our understanding of subduction processes and deep-focus earthquakes. Here, we demonstrate that well-resolved X-ray diffraction patterns can be obtained on nano-grained thin films within laser-heated diamond anvil cells (DACs) at hydrostatic pressures up to 24 GPa and temperatures up to 2300 K. Combined with well-established literature processes for tuning thin film grain size, biaxial stress, and substrate identity, these results suggest that DAC-loaded thin films can be useful for determining how grain size, deviatoric stress, and/or the coexistence of other phases influence high-pressure phase stability. As such, this novel DAC-loaded thin film approach may find use in a variety of earth science, planetary science, solid-state physics, and materials science applications. 
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